Download PDF by Bruce A. Tuttle, Chonglin Chen, Quanxi Jia, R. Ramesh: Advanced Dielectric, Piezoelectric and Ferroelectric Thin

By Bruce A. Tuttle, Chonglin Chen, Quanxi Jia, R. Ramesh

ISBN-10: 1118407202

ISBN-13: 9781118407202

ISBN-10: 1574981838

ISBN-13: 9781574981834

Advances in synthesis and characterization of dielectric, piezoelectric and ferroelectric skinny motion pictures are incorporated during this quantity. Dielectric, piezoelectric and ferroelectric skinny motion pictures have an important influence on quite a few advertisement and armed forces platforms together with tunable microwave units, stories, MEMS units, actuators and sensors. contemporary paintings on piezoelectric characterization, AFE to FE dielectric section transformation dielectrics, answer and vapor deposited skinny movies, and fabrics integration are one of the subject matters integrated. Novel methods to nanostructuring, characterization of fabric homes and actual responses on the nanoscale is also included.Content:

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Additional resources for Advanced Dielectric, Piezoelectric and Ferroelectric Thin Films, Volume 162

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A target with the Pb/Sr ratio of 35:65 plus 20 at. % excess Pb was adopted for the film deposition to avoid the Pb deficiency because Pb is easily lost during deposition. Pulsed laser ablation was employed for the deposition of PSTO films. 0 nm/min. Microstructure characterizations by x-ray diffraction (XRD) and transmission electron microscopy (TEM) were performed to investigate the crystallinity and epitaxial quality. Dielectric property measurements were carried out with traditional interdigital technique.

I -18- Pt/BST/Pt BST. 500 °C, 200nm /—«> j -20- J & -22- "5a -24-/ < ^ >. XN^Ns22Vo1ls -26- v t* ,„■ *=S -28- ~c -3010 15 20 25 30 35 40 VA (Volts) Figure 3 J-V characteristics of a Pt/BST/Pt thin film capacitor. S. 8 1000/T(1/K) Figure 4 Schottky plot (ln[J/T2] versus 1000/T) of the data set shown in Fig. 3. BST capacitor reliability For the basic reliability study, time dependent dielectric breakdown (TDDB) measurements [7] were performed. The life time of the capacitors were defined that failure occurs when the leakage current increases by a factor of 10 from its minimum value.

Symp. Proc. 243, (1991)]. 48 • Advanced Dielectric, Piezoelectric and Ferroelectric Thin Films 2 C. L. Chen, H. H. Feng, Z. Zhang, A. Brazdeikis, Z. J. Huang, W. K. Chu, C. W. Chu, F. A. Miranda, F. W. Van Keuls, R. R. Romanofsky, and Y. Liou, Appl. Phys. Lett. 75, 412 (1999); i. , 78 (2001) 652. 3 K. R. Carroll, J. M. Pond, D. B. Chrisey, J. S. Horwitz, and R. E. Leuchtner, Appl. Phys. Lett. b, 63, 1292 (1993). 4 Q. X. Jia, J. R. Groves, P. Arendt, Y. Fan, A. T. Findikoglu, S. R. Foltyn, H. Jiang, and F.

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