Download e-book for iPad: An Introduction to Mixed-Signal IC Test and Measurement by Gordon Roberts, Friedrich Taenzler, Mark Burns

By Gordon Roberts, Friedrich Taenzler, Mark Burns

ISBN-10: 0195140168

ISBN-13: 9780195140163

Built-in circuits incorporating either electronic and analog capabilities became more and more favourite within the semiconductor undefined. Mixed-signal IC try out and size has grown right into a hugely really good box of electric engineering. even if, try out engineering remains to be a comparatively unknown occupation in comparison to IC layout engineering. It has develop into more durable to rent and teach new engineers to develop into expert mixed-signal try engineers. The sluggish studying curve for mixed-signal try out engineers is basically end result of the scarcity of written fabrics and university-level classes just about mixed-signal trying out. whereas many textbooks were dedicated to the topic of electronic try out and testability, an analogous can't be stated for analog and mixed-signal computerized try out and measurement.An advent to Mixed-Signal IC attempt and size is a textbook for complicated undergraduate and graduate-level scholars in addition to engineering execs. It was once written based on the lack of uncomplicated path fabric for mixed-signal try out and dimension. The e-book assumes an excellent heritage in analog and electronic circuits in addition to a operating wisdom of pcs and machine programming. A heritage in electronic sign processing and statistical research is additionally important, notwithstanding now not totally necessary.This textual content encompasses the trying out of either analog and mixed-signal circuits together with many borderline examples. electronic checking out is roofed, yet now not as generally a result of wealth of knowledge in this subject already on hand. Examples and illustrations utilizing state of the art commercial know-how increase and brighten up the presentation all through. In contemplating the functions of this expertise, the trying out of large-scale mixed-signal circuits and person circuits is brought. The value-added advantages of mixed-signal IC trying out to a manufacturer's product are truly mentioned, and the function of the try engineer is obviously outlined.

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Additional resources for An Introduction to Mixed-Signal IC Test and Measurement

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New York, NY 10158-0012,1987,ISBN: 0471851353 5. David A. 1 Purpose of a Data Sheet Beginning test engineers often spend a great deal of time learning how to generatetest plans for mixed-signal devices. A test plan is a written list of tests and test procedures that will be used to verify the quality of a particular device under test (DUT). The definition of a production test plan usually begins with a device data sheet or specification sheet, as it is often called. Unfortunately, the data sheet does not directly translate into a fInite list of all required production tests.

The feature summary allows the customer to quickly gauge the device's fit to a particular application. The test engineer can generally ignore this section since the same infonnation is typically called out in subsequentsections of the data sheet. The pinout and package infonnation is much more relevant to test engineering. The test engineer refers to the pinout and packageinfonnation to design the DIB for each packagetype. The device description gives a quick overview of the device's functionality.

25 145 Referencevoltage. 5 V 40 ns 0 0 ns Data bus input setup time, tsu(D) 25 25 ns Data bus input hold time, Ih(D) 10 10 ns Pulse duration,WRlow, tw(WR\ 40 40 TlC7524C Operating free-air temperature. C TlC7524E -40 85 -40 85 electrical characteristics over recommendedoperating free-air temperature range, Vref= :1:10 V, OUT1and OUT2at GND(unless otherwise noted) PARAMETER IIH High-level input current VI=VDD IlL Low-level input current VI = 0 OUT1 Ilkg Output leakage current IDD Supply current OUT2 TYP -- DBo-DB7 at 0 V, WR, CS at 0 V, Vref=J;10V DBa-DB7 at VDD, WR, CS at 0 V.

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An Introduction to Mixed-Signal IC Test and Measurement by Gordon Roberts, Friedrich Taenzler, Mark Burns


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