Read Online or Download C62.36-2000 IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits PDF
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Additional resources for C62.36-2000 IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits
Then, connect a length of shorting conductor between the first probe at its point of connection to the circuit and the second, disconnected probe. The length of the shorting conductor should be such as to maintain the same probe spacing. This results in the two probes being connected together by the shorting conductor, but connected to the circuit at one point. A measurement is then made of the voltage across the shorting conductor when the test impulse is reapplied. This measurement is a good representation of any noise voltage that is present on the required signal.
2 The impulse current shall be applied at each applicable port, separately and not simultaneously, between each applicable line and common terminal or other designated terminals; and the resulting coupled voltage and waveform shall be measured at each of the other ports, between the line and common terminals or other designated terminals. See Table 10 for combinations of terminal pairs to be tested with reference to Figure 22. C I V X1–X2, W1–W2, U1–U2 Y1–Y2, Z1–Z2, V1–V2 CX, CW, CU CY, CZ, C V = = = = = = = common terminal of multiport surge protector current-limiting function voltage-limiting function input port output port common terminal at input port common terminal at output port Figure 22—Representative configuration for multiport coupling test 42 Copyright © 2000 IEEE.
Sufficient time between impulses shall be allowed to prevent thermal accumulation. The impulse-limiting voltage is the measured peak voltage between the appropriate terminals of the protector. In some cases, the measured peak voltage may occur well after the peak of the generator current. For each test current waveform used, at least one impulse-limiting voltage measurement shall be made over a time interval that is at least 5 times the virtual time to half-value for that waveform. Copyright © 2000 IEEE.
C62.36-2000 IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits by IEEE