By Dongwoo Hong
With the expanding call for for greater information bandwidth, verbal exchange structures’ info premiums have reached the multi-gigahertz variety or even past. Advances in semiconductor applied sciences have sped up the adoption of high-speed serial interfaces, reminiscent of PCI-Express, Serial-ATA, and XAUI, with the intention to mitigate the excessive pin-count and the data-channel skewing difficulties. even though, with the expanding variety of I/O pins and larger facts premiums, major demanding situations come up for checking out high-speed interfaces by way of attempt price and caliber, particularly in excessive quantity production (HVM) environments. Efficient attempt Methodologies for High-Speed Serial hyperlinks describes intimately numerous new and promising thoughts for cost-effectively checking out high-speed interfaces with a excessive attempt insurance. One basic concentration of Efficient try out Methodologies for High-Speed Serial hyperlinks is on effective trying out equipment for jitter and bit-error-rate (BER), that are primary for quantifying the standard of a verbal exchange approach. quite a few research in addition to experimental effects are awarded to illustrate the validity of the provided techniques.
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In;TJ D ™in;p C ¢RJ /, to Eq. 2 instead of ™in;p to take into account the RJ contribution to the jitter magnitude. While RJ has an unbounded characteristic, we use the rms value of RJ for calculating the jitter magnitude. Regarding the slope, the predicted functions, which have 20 dB=dec slope in the slewing region, have a steeper slope than those of the simulated curves. The solid gray lines in Fig. 7 are the best-fit lines for the simulated data in the slewing region. It is interesting to note that the slope of the slewing region depends upon the ratio between PJ and RJ.
We show the dependency of a BB CDR loop’s jitter transfer function on the magnitudes of PJ and RJ. We further propose an analytical technique to estimate the BER. The simulation results demonstrate the validity of our analysis. We will further conduct hardware validation, using suitable measurement equipment to assess the accuracy of the proposed estimation method. Chapter 5 Gaps in Timing Margining Test With the challenges of keeping testing costs down, DFT-based testing methods have been pursued [6–9, 47, 48].
If ™out slews for most of the period, t0 is approximately equal to T™ =4. t0 / D ˇ™in;p cos. 3) The details of the derivation can be found in . Based on Eq. 3, we can calculate the maximum tolerable input jitter by expressing ™in;p in terms of w™ when the maximum phase error, ™max , is equal to . 2 BER Estimation The behavior of a BB CDR loop is well understood when only PJ is present in the data. However, the analysis becomes much more complex when RJ is also present. In the last section, we have shown that the jitter transfer function of the BB CDR loop varies with respect to the PJ magnitude.
Efficient Test Methodologies for High-Speed Serial Links by Dongwoo Hong